A transistor screening procedure using leakage current measurements
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation
سال: 1965
ISSN: 0022-4316
DOI: 10.6028/jres.069c.037